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%0 Conference Paper
%1 kamm2021hybrid
%A Kamm, Simon
%A Sharma, Kanuj
%A Kallfass, Ingmar
%A Jazdi, Nasser
%A Weyrich, Michael
%B 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
%D 2021
%I IEEE
%K
%R 10.1109/IPFA53173.2021.9617401
%T Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data
%@ 978-1-6654-3988-6 and 978-1-6654-3989-3
@inproceedings{kamm2021hybrid,
added-at = {2023-08-31T16:13:58.000+0200},
affiliation = {Kamm, S (Corresponding Author), Univ Stuttgart, Inst Ind Automat & Software Engn, Pfaffenwaldring 47, Stuttgart, Germany.
Kamm, Simon; Jazdi, Nasser; Weyrich, Michael, Univ Stuttgart, Inst Ind Automat & Software Engn, Pfaffenwaldring 47, Stuttgart, Germany.
Sharma, Kanuj; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Pfaffenwaldring 47, Stuttgart, Germany.},
author = {Kamm, Simon and Sharma, Kanuj and Kallfass, Ingmar and Jazdi, Nasser and Weyrich, Michael},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b8616ead4735f2423ad2f17d43d8e17e/puma-wartung},
booktitle = {2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)},
doi = {10.1109/IPFA53173.2021.9617401},
eventdate = {2021-09-14/2021-10-13},
eventtitle = {IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)},
interhash = {1102c2ece36dac2e6c30ba69199f858b},
intrahash = {b8616ead4735f2423ad2f17d43d8e17e},
isbn = {{978-1-6654-3988-6} and {978-1-6654-3989-3}},
keywords = {},
language = {eng},
publisher = {IEEE},
timestamp = {2023-08-31T14:13:58.000+0200},
title = {Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data},
unique-id = {WOS:000782378200072},
venue = {Online},
year = 2021
}