%0 Journal Article %1 journals/et/Al-AsaadHM98 %A Al-Asaad, Hussain %A Hayes, John P. %A Murray, Brian T. %D 1998 %J J. Electronic Testing %K dblp %N 1-2 %P 111-125 %T Scalable Test Generators for High-Speed Datapath Circuits. %U http://dblp.uni-trier.de/db/journals/et/et12.html#Al-AsaadHM98 %V 12

@article{journals/et/Al-AsaadHM98, added-at = {2009-03-22T00:00:00.000+0100}, author = {Al-Asaad, Hussain and Hayes, John P. and Murray, Brian T.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/287e7ae04cee42759fc42ec1ed6acf785/dblp}, ee = {http://dx.doi.org/10.1023/A:1008242108853}, interhash = {02b7081eb97182702fe7704b7a94cc58}, intrahash = {87e7ae04cee42759fc42ec1ed6acf785}, journal = {J. Electronic Testing}, keywords = {dblp}, number = {1-2}, pages = {111-125}, timestamp = {2016-02-02T10:07:30.000+0100}, title = {Scalable Test Generators for High-Speed Datapath Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et12.html#Al-AsaadHM98}, volume = 12, year = 1998 }