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ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.

A. Asenov, U. Schlichtmann, C. Tan, H. Wong, and X. Zhou. Microelectronics Reliability, 52 (8): 1531 (2012)

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Sebastian Asenbeck University of Stuttgart

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Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET.U. Kovac, D. Reid, C. Millar, G. Roy, S. Roy, and A. Asenov. Microelectronics Reliability, 48 (8-9): 1572-1575 (2008)Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability.X. Wang, B. Cheng, A. Brown, C. Millar, and A. Asenov. ESSDERC, page 349-352. IEEE, (2014)Ab-initio Coulomb Scattering in Atomistic Device Simulation.C. Arokianathan, J. Davies, and A. Asenov. VLSI Design, 1998 (1): 331-335 (1998)Non-Equilibrium Hole Transport in Deep Sub-Micron Well-Tempered Si p-MOSFETs.J. Watling, Y. Zhao, A. Asenov, and J. Barker. VLSI Design, 2001 (1): 169-173 (2001)RF Performance of Si/SiGe MODFETs: A Simulation Study.S. Roy, A. Asenov, S. Babiker, J. Barker, and S. Beaumont. VLSI Design, 1998 (1): 325-330 (1998)Topologically Rectangular Grids in the Parallel Simulation of Semiconductor Devices.A. Asenov, A. Brown, S. Roy, and J. Barker. VLSI Design, 1998 (1): 91-95 (1998)A New Approach based on Brownian Motion for the Simulation of Ultra-Small Semiconductor Devices.C. Arokianathan, A. Asenov, and J. Davies. VLSI Design, 1998 (1): 243-246 (1998)ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.A. Asenov, U. Schlichtmann, C. Tan, H. Wong, and X. Zhou. Microelectronics Reliability, 52 (8): 1531 (2012)Special section reliability and variability of devices for circuits and systems.A. Asenov, U. Schlichtmann, C. Tan, H. Wong, and X. Zhou. Microelectronics Reliability, 54 (6-7): 1057 (2014)Statistical NBTI-effect prediction for ULSI circuits.T. Tang, A. Murray, B. Cheng, and A. Asenov. ISCAS, page 2494-2497. IEEE, (2010)

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ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.

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Sebastian Asenbeck University of Stuttgart

Other publications of authors with the same name

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Disambiguation of "Asenov, Asen"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.

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Sebastian Asenbeck University of Stuttgart

Other publications of authors with the same name

Disambiguation

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ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.