%0 Journal Article %1 journals/mr/AsenovSTWZ14 %A Asenov, Asen %A Schlichtmann, Ulf %A Tan, Cher Ming %A Wong, Hei %A Zhou, Xing %D 2014 %J Microelectronics Reliability %K dblp %N 6-7 %P 1057 %T Special section reliability and variability of devices for circuits and systems. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#AsenovSTWZ14 %V 54

@article{journals/mr/AsenovSTWZ14, added-at = {2019-09-16T00:00:00.000+0200}, author = {Asenov, Asen and Schlichtmann, Ulf and Tan, Cher Ming and Wong, Hei and Zhou, Xing}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/237a097c0e10f657de4686fed0899ae4e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.03.010}, interhash = {6b6a61acc07080d22bb1a7888f60c1f8}, intrahash = {37a097c0e10f657de4686fed0899ae4e}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {6-7}, pages = 1057, timestamp = {2019-09-27T10:58:24.000+0200}, title = {Special section reliability and variability of devices for circuits and systems.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#AsenovSTWZ14}, volume = 54, year = 2014 }