T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2009)5 cites: https://scholar.google.com/scholar?cites=15570446517660484183&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... Proc. SPIE, (2012)3 cites: https://scholar.google.com/scholar?cites=3562043095514685385&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, T. Haist, and W. Osten. Optical Micro-and Nanometrology …, (2012)5 cites: https://scholar.google.com/scholar?cites=8284401030473063862&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... AIP Conference …, (2012)5 cites: https://scholar.google.com/scholar?cites=2722836634404284020&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, T. Haist, A. Peter, A. Beeck, and .... Proc. SPIE, (2014)4 cites: https://scholar.google.com/scholar?cites=15964016983552008003&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, and E. Manske. Ultra-High-Definition Imaging …, (2018)4 cites: https://scholar.google.com/scholar?cites=15533727869778562690&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2008)10 cites: https://scholar.google.com/scholar?cites=17386422767713101032&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, M. Warber, C. Rembe, T. Haist, and W. Osten. Fringe 2009, (2009)8 cites: https://scholar.google.com/scholar?cites=14883763856837803297&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, F. Schaal, and .... AIP Conference …, (2010)10 cites: https://scholar.google.com/scholar?cites=9989101753206569078&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, M. Hasler, T. Haist, and .... European Conference on …, (2011)9 cites: https://scholar.google.com/scholar?cites=14528589801084573186&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, D. Fleischle, T. Haist, and .... Optical Inspection and …, (2009)11 cites: https://scholar.google.com/scholar?cites=16198342556063896427&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and .... Proc. SPIE, (2010)13 cites: https://scholar.google.com/scholar?cites=11729316344759848032&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, J. Hafner, M. Warber, and .... Proc. SPIE, (2008)16 cites: https://scholar.google.com/scholar?cites=3067665973075008776&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, A. Burla, T. Haist, J. Zimmermann, and .... Optical Micro-and …, (2010)14 cites: https://scholar.google.com/scholar?cites=1524075053293164982&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, M. Aissa, and .... … Systems for Industrial …, (2011)14 cites: https://scholar.google.com/scholar?cites=8158545852653943976&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, S. Zwick, M. Hasler, T. Haist, and .... Proc. SPIE, (2009)25 cites: https://scholar.google.com/scholar?cites=17119986543695143245&as_sdt=2005&sciodt=0,5&hl=en.