P. Somers, J. Schüle, C. Tarín, and O. Sawodny. 2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), page 4222-4225. (November 2021)
T. Haist, C. Lingel, W. Osten, M. Winter, and .... Proc. SPIE, (2012)3 cites: https://scholar.google.com/scholar?cites=3562043095514685385&as_sdt=2005&sciodt=0,5&hl=en.
U. Afzal, C. Merten, and M. Aleysa. 22.11 - 23.11.2017, Babol, Iran, (2017)ICHMT2017, 22.11 - 23.11.2017, Babol Noshirvani University of Technology, Babol, Iran.
W. Osten, G. Pedrini, P. Weidmann, and R. Gadow. SPECKLE 2015: VI International Conference on Speckle Metrology, 9660, page 96600H. International Society for Optics and Photonics, SPIE, (2015)
F. Beck, M. Hirschler, U. Nieken, and P. Eberhard. 2014, Erlangen, Germany, (2014)Proceedings of the 85th Annual Meeting of the International Association of Applied Mathematics and Mechanics, 2014, Erlangen, Germany.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... AIP Conference …, (2012)5 cites: https://scholar.google.com/scholar?cites=2722836634404284020&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, F. Schaal, and .... AIP Conference …, (2010)10 cites: https://scholar.google.com/scholar?cites=9989101753206569078&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and .... Proc. SPIE, (2010)13 cites: https://scholar.google.com/scholar?cites=11729316344759848032&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, T. Haist, A. Peter, A. Beeck, and .... Proc. SPIE, (2014)4 cites: https://scholar.google.com/scholar?cites=15964016983552008003&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, T. Haist, A. Peter, A. Beeck, C. Pruss, and W. Osten. Holography, Diffractive Optics, and Applications VI, 9271, page 927105. International Society for Optics and Photonics, SPIE, (2014)
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, M. Aissa, and .... … Systems for Industrial …, (2011)14 cites: https://scholar.google.com/scholar?cites=8158545852653943976&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, A. Burla, T. Haist, J. Zimmermann, and .... Optical Micro-and …, (2010)14 cites: https://scholar.google.com/scholar?cites=1524075053293164982&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, D. Fleischle, T. Haist, and .... Optical Inspection and …, (2009)11 cites: https://scholar.google.com/scholar?cites=16198342556063896427&as_sdt=2005&sciodt=0,5&hl=en.
D. Buchta, N. Hein, G. Pedrini, C. Krekel, and W. Osten. Optics for Arts, Architecture, and Archaeology V, 9527, page 95270Q. International Society for Optics and Photonics, SPIE, (2015)
C. Walter, M. Hopp-Hirschler, and U. Nieken. International Center for Numerical Methods in Engineering (CIMNE), Proceedings of the 5th International Conference on Particle-Based Methods (Particles 2017), International Center for Numerical Methods in Engineering (CIMNE), (2017)
A. Birk, K. Frenner, and W. Osten. Fifteenth International Conference on Machine Vision (ICMV 2022), 12701, page 1270109. International Society for Optics and Photonics, SPIE, (2023)
T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)