Today, we publish two papers on Open Access (OA), a first one on successful OA implementation and a second one on OA for conference proceedings in engineering disciplines. On top of that, our association endorses the Action Plan for Diamond Open Access.
TextRelease is an initiative headed by Dr. Dominic J. Farace recognized for his accomplishments in the field of grey literature. Grey Literature is produced and distributed on all levels of government, academics, business and industry in print and electronic formats not controlled by commercial publishers i.e. where publishing is not the primary activity of the publishing body.
H. Yang, T. Haist, M. Gronle, and W. Osten. Optical Measurement Systems for Industrial Inspection IX, 9525, page 952522. International Society for Optics and Photonics, SPIE, (2015)
H. Yang, T. Haist, M. Gronle, and W. Osten. Automated Visual Inspection and Machine Vision II, 10334, page 1033405. International Society for Optics and Photonics, SPIE, (2017)
T. Haist, A. Steinitz, and F. Guerra. Optics and Photonics for Advanced Dimensional Metrology, 11352, page 1135204. International Society for Optics and Photonics, SPIE, (2020)
R. Hahn, J. Görres, T. Haist, W. Osten, and S. Reichelt. Optical Sensing and Detection VII, 12139, page 121390I. International Society for Optics and Photonics, SPIE, (2022)
S. Amann, T. Haist, A. Gatto, M. Kamm, and A. Herkommer. Photonic Instrumentation Engineering X, 12428, page 124280G. International Society for Optics and Photonics, SPIE, (2023)
S. Hartlieb, M. Boguslawski, T. Haist, and S. Reichelt. Optics and Photonics for Advanced Dimensional Metrology II, 12137, page 1213702. International Society for Optics and Photonics, SPIE, (2022)
F. Schaal, T. Haist, A. Peter, A. Beeck, C. Pruss, and W. Osten. Holography, Diffractive Optics, and Applications VI, 9271, page 927105. International Society for Optics and Photonics, SPIE, (2014)
J. Schindler, G. Baer, C. Pruss, and W. Osten. International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 9297, page 92971R. International Society for Optics and Photonics, SPIE, (2014)
A. Bielke, G. Baer, C. Pruss, and W. Osten. 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 9618, page 961807. International Society for Optics and Photonics, SPIE, (2015)
J. Schindler, C. Pruss, and W. Osten. Optical Measurement Systems for Industrial Inspection X, 10329, page 1032904. International Society for Optics and Photonics, SPIE, (2017)
A. Harsch, C. Pruss, A. Haberl, and W. Osten. Fifth European Seminar on Precision Optics Manufacturing, 10829, page 1082908. International Society for Optics and Photonics, SPIE, (2018)
A. Harsch, C. Pruss, G. Baer, and W. Osten. Sixth European Seminar on Precision Optics Manufacturing, 11171, page 111710C. International Society for Optics and Photonics, SPIE, (2019)
R. Beisswanger, C. Pruss, C. Schober, A. Harsch, and W. Osten. Optical Measurement Systems for Industrial Inspection XI, 11056, page 110561G. International Society for Optics and Photonics, SPIE, (2019)
C. Schober, C. Pruss, A. Herkommer, and W. Osten. Seventh European Seminar on Precision Optics Manufacturing, 11478, page 1147807. International Society for Optics and Photonics, SPIE, (2020)
A. Faridian, G. Pedrini, and W. Osten. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 8949, page 89490H. International Society for Optics and Photonics, SPIE, (2014)
D. Buchta, N. Hein, G. Pedrini, C. Krekel, and W. Osten. Optics for Arts, Architecture, and Archaeology V, 9527, page 95270Q. International Society for Optics and Photonics, SPIE, (2015)
W. Osten, G. Pedrini, P. Weidmann, and R. Gadow. SPECKLE 2015: VI International Conference on Speckle Metrology, 9660, page 96600H. International Society for Optics and Photonics, SPIE, (2015)
S. Ludwig, A. Singh, G. Pedrini, and W. Osten. Unconventional Optical Imaging, 10677, page 1067717. International Society for Optics and Photonics, SPIE, (2018)
S. Ludwig, G. Pedrini, X. Peng, and W. Osten. Optical Measurement Systems for Industrial Inspection XII, 11782, page 1178214. International Society for Optics and Photonics, SPIE, (2021)
S. Reichelt, and G. Pedrini. Proceedings of the 2023 6th International Conference on Machine Vision and Applications, page 72–80. New York, NY, USA, Association for Computing Machinery, (Jun 9, 2023)
A. Toulouse, S. Thiele, and A. Herkommer. Optical Design Challenge 2019, 11040, page 1104009. International Society for Optics and Photonics, SPIE, (2019)
J. Drozella, A. Toulouse, S. Thiele, and A. Herkommer. Novel Optical Systems, Methods, and Applications XXII, 11105, page 1110506. International Society for Optics and Photonics, SPIE, (2019)
S. Thiele, A. Toulouse, S. Ristok, H. Giessen, and A. Herkommer. 3D Printed Optics and Additive Photonic Manufacturing II, 11349, page 1134904. International Society for Optics and Photonics, SPIE, (2020)
H. Li, L. Fu, K. Frenner, and W. Osten. Modeling Aspects in Optical Metrology VI, 10330, page 103300Y. International Society for Optics and Photonics, SPIE, (2017)
C. Bett, M. Daiber-Huppert, K. Frenner, and W. Osten. Fifteenth International Conference on Machine Vision (ICMV 2022), 12701, page 1270107. International Society for Optics and Photonics, SPIE, (2023)
A. Birk, K. Frenner, and W. Osten. Fifteenth International Conference on Machine Vision (ICMV 2022), 12701, page 1270109. International Society for Optics and Photonics, SPIE, (2023)
T. Haist, M. Gronle, T. Arnold, D. Bui, and .... Forum …, (2014)1 cites: https://scholar.google.com/scholar?cites=10236970921957896968&as_sdt=2005&sciodt=0,5&hl=en.
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, A. Michael, and .... Proc. SPIE, (2010)1 cites: https://scholar.google.com/scholar?cites=12869458722280783790&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
H. Yang, T. Haist, M. Gronle, and .... Forum Bildverarbeitung …, (2016)2 cites: https://scholar.google.com/scholar?cites=8919893009457312879&as_sdt=2005&sciodt=0,5&hl=en.
D. Fleischle, W. Lyda, T. Haist, and W. Osten. DGaO Proceedings, (2009)4 cites: https://scholar.google.com/scholar?cites=16419362578584721445&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2009)5 cites: https://scholar.google.com/scholar?cites=15570446517660484183&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... Proc. SPIE, (2012)3 cites: https://scholar.google.com/scholar?cites=3562043095514685385&as_sdt=2005&sciodt=0,5&hl=en.