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S. Amann, T. Haist, A. Gatto, M. Kamm, and A. Herkommer. Photonic Instrumentation Engineering X, 12428, page 124280G. International Society for Optics and Photonics, SPIE, (2023)
R. Hahn, J. Görres, T. Haist, W. Osten, and S. Reichelt. Optical Sensing and Detection VII, 12139, page 121390I. International Society for Optics and Photonics, SPIE, (2022)
T. Haist, A. Steinitz, and F. Guerra. Optics and Photonics for Advanced Dimensional Metrology, 11352, page 1135204. International Society for Optics and Photonics, SPIE, (2020)
H. Yang, T. Haist, M. Gronle, and W. Osten. Automated Visual Inspection and Machine Vision II, 10334, page 1033405. International Society for Optics and Photonics, SPIE, (2017)
H. Yang, T. Haist, M. Gronle, and W. Osten. Optical Measurement Systems for Industrial Inspection IX, 9525, page 952522. International Society for Optics and Photonics, SPIE, (2015)
S. Dong, T. Haist, T. Dietrich, and W. Osten. Unconventional Imaging and Wavefront Sensing 2014, 9227, page 922702. International Society for Optics and Photonics, SPIE, (2014)
B. Chen, S. Thiele, M. Xu, and A. Herkommer. Optical Design and Engineering VII, 10690, page 1069016. International Society for Optics and Photonics, SPIE, (2018)
S. Amann, T. Haist, A. Gatto, M. Kamm, and S. Reichelt. Digital Optical Technologies 2023, 12624, page 126240M. International Society for Optics and Photonics, SPIE, (2023)
T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)
C. Bett, K. Frenner, S. Reichelt, and W. Osten. Optical Measurement Systems for Industrial Inspection XIII, 12618, page 126181C. International Society for Optics and Photonics, SPIE, (2023)
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