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Disambiguation of "Hatayama, Kazumi"

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A Variability-Aware Adaptive Test Flow for Test Quality Improvement.

, , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (7): 1056-1066 (2014)

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Other publications of authors with the same name

Application of a Design for Delay Testability Approach to High Speed Logic LSIs., , , , and . Asian Test Symposium, page 112-115. IEEE Computer Society, (1997)Application of High-Quality Built-In Test to Industrial Designs., , , , , and . ITC, page 1003-1012. IEEE Computer Society, (2002)Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing., , , , and . J. Electronic Testing, 32 (5): 601-609 (2016)A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment., , , , , , , and . ICCAD, page 97-104. ACM, (2009)Innovative Test Practices in Japan., , , , , , , , , and 4 other author(s). VTS, page 1. IEEE, (2019)Session Abstract.. VTS, page 200-201. IEEE Computer Society, (2006)An Adaptive Test for Parametric Faults Based on Statistical Timing Information., , , , , , , and . Asian Test Symposium, page 151-156. IEEE Computer Society, (2009)Accelerated Test Points Selection Method for Scan-Based BIST., , and . Asian Test Symposium, page 359-. IEEE Computer Society, (1997)Enhanced Delay Test Generator for High-Speed Logic LSIs., , , , , and . ITC, page 161-165. IEEE Computer Society, (1989)Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification., , , , , , , , and . ICCAD, page 52-58. IEEE Computer Society, (2008)