PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Nakao, Michinobu"

Author of the publication

copydeleteadd this publication to your clipboard
Accelerated Test Points Selection Method for Scan-Based BIST.

, , and . Asian Test Symposium, page 359-. IEEE Computer Society, (1997)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Nakao, Michinobu
add a person with the name Nakao, Michinobu
 

Other publications of authors with the same name

Accelerated Test Points Selection Method for Scan-Based BIST., , and . Asian Test Symposium, page 359-. IEEE Computer Society, (1997)Low overhead test point insertion for scan-based BIST., , , , and . ITC, page 348-357. IEEE Computer Society, (1999)Reduction of Area per Good Die for SoC Memory Built-In Self-Test., , , , and . IEICE Transactions, 93-A (12): 2463-2471 (2010)A parallel sequential test generation system DESCARTES based on real-valued logic simulation., , and . Asian Test Symposium, page 252-258. IEEE Computer Society, (1995)Test Generation for Multiple-Threshold Gate-Delay Fault Model., , , , and . Asian Test Symposium, page 244-. IEEE Computer Society, (2001)Application of High-Quality Built-In Test to Industrial Designs., , , , , and . ITC, page 1003-1012. IEEE Computer Society, (2002)Hardware Overhead Reduction for Memory BIST., , , and . ITC, page 1. IEEE Computer Society, (2008)At-Speed Built-in Test for Logic Circuits with Multiple Clocks., , and . Asian Test Symposium, page 292-297. IEEE Computer Society, (2002)A BIST approach for very deep sub-micron (VDSM) defects., , , and . ITC, page 283-291. IEEE Computer Society, (2000)Enhancing Transition Fault Model for Delay Defect Diagnosis., , , , , , , , and . ATS, page 179-184. IEEE Computer Society, (2008)