Author of the publication

Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect.

, , , , and . DAC, page 534-539. ACM, (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Trojan detection based on delay variations measured using a high-precision, low-overhead embedded test structure., and . HOST, page 75-82. IEEE Computer Society, (2012)An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities., , , and . IEEE Trans. Information Forensics and Security, 6 (3-2): 1170-1179 (2011)On detecting delay anomalies introduced by hardware trojans., , , , and . ICCAD, page 44. ACM, (2016)Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect., , , , and . DAC, page 534-539. ACM, (2011)A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique., , , and . DAC, page 59:1-59:10. ACM, (2013)Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL., , , and . IEEE Trans. VLSI Syst., 23 (4): 776-780 (2015)REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations., , , , and . ICCAD, page 170-177. IEEE Computer Society, (2011)Stability analysis of a physical unclonable function based on metal resistance variations., , , and . HOST, page 143-150. IEEE Computer Society, (2013)