%0 Conference Paper %1 conf/iccad/LamechAPRA11 %A Lamech, Charles %A Aarestad, Jim %A Plusquellic, Jim %A Rad, Reza M. %A Agarwal, Kanak %B ICCAD %D 2011 %E Phillips, Joel R. %E Hu, Alan J. %E Graeb, Helmut %I IEEE Computer Society %K dblp %P 170-177 %T REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2011.html#LamechAPRA11 %@ 978-1-4577-1399-6

@inproceedings{conf/iccad/LamechAPRA11, added-at = {2015-05-01T00:00:00.000+0200}, author = {Lamech, Charles and Aarestad, Jim and Plusquellic, Jim and Rad, Reza M. and Agarwal, Kanak}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2927ce8d39896c0b9841c81b9fc43ef7a/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2011}, editor = {Phillips, Joel R. and Hu, Alan J. and Graeb, Helmut}, ee = {http://dl.acm.org/citation.cfm?id=2132365}, interhash = {e64984e22cf12a80a9cc02f043d1f4c8}, intrahash = {927ce8d39896c0b9841c81b9fc43ef7a}, isbn = {978-1-4577-1399-6}, keywords = {dblp}, pages = {170-177}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T13:49:16.000+0100}, title = {REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2011.html#LamechAPRA11}, year = 2011 }