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Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability.

D. Tsiena, C. Wang, W. Wang, Y. Ran, P. Hurat, and N. Verghese. SoCC, page 261-268. IEEE, (2007)

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Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

Other publications of authors with the same name

A Practical Application of Full-Feature Alternating Phase-Shifting Technology for a Phase-Aware Standard-Cell Design Flow.M. Sanie, M. Côté, P. Hurat, and V. Malhotra. DAC, page 93-96. ACM, (2001)Modeling and Validation of Silicon Contour-Based Extraction and Simulation of Non-Uniform Devices.T. Devoivre, R. Rouse, N. Verghese, and P. Hurat. CICC, page 615-618. IEEE, (2007)APLYSIE : un circuit neuro-mimétique : réalisation et intégration sur tranche. (APLYSIE: a neuro-mimetic integrated circuit. Design and wafer scale integration).P. Hurat. Grenoble Institute of Technology, France, (1989)Addressing Parametric Impact of Systematic Pattern Variations in Digital IC Design.P. Wang, B. Lee, G. Han, R. Rouse, P. Hurat, and N. Verghese. CICC, page 587-590. IEEE, (2007)Standard Cell Printability Grading and Hot Spot Detection.M. Côté, and P. Hurat. ISQED, page 264-269. IEEE Computer Society, (2005)Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability.D. Tsiena, C. Wang, W. Wang, Y. Ran, P. Hurat, and N. Verghese. SoCC, page 261-268. IEEE, (2007)Layout Printability Optimization Using a Silicon Simulation Methodology.M. Côté, and P. Hurat. ISQED, page 159-164. IEEE Computer Society, (2004)Predictive models and CAD methodology for pattern dependent variability.N. Verghese, R. Rouse, and P. Hurat. ASP-DAC, page 213-218. IEEE, (2008)DFM: Linking Design and Manufacturing.S. Raghvendra, and P. Hurat. VLSI Design, page 705-708. IEEE Computer Society, (2005)

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Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability.

Please choose a person to relate this publication to

Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguierung von "Hurat, Philippe"

Kopierendeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability.

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Jun. -Prof. Dr. Philippe Grönquist University of Stuttgart

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Disambiguation

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Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability.