%0 Conference Paper %1 conf/socc/TsienaWWRHV07 %A Tsiena, Darsun %A Wang, Chien Kuo %A Wang, William W. J. %A Ran, Yajun %A Hurat, Philippe %A Verghese, Nishath %B SoCC %D 2007 %I IEEE %K dblp %P 261-268 %T Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability. %U http://dblp.uni-trier.de/db/conf/socc/socc2007.html#TsienaWWRHV07 %@ 978-1-4244-1592-2

@inproceedings{conf/socc/TsienaWWRHV07, added-at = {2012-05-22T00:00:00.000+0200}, author = {Tsiena, Darsun and Wang, Chien Kuo and Wang, William W. J. and Ran, Yajun and Hurat, Philippe and Verghese, Nishath}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28bfdc6620c2063457d5163d44a94233d/dblp}, booktitle = {SoCC}, crossref = {conf/socc/2007}, ee = {http://dx.doi.org/10.1109/SOCC.2007.4545471}, interhash = {f8a64669e15dafcf78e43a7761b06626}, intrahash = {8bfdc6620c2063457d5163d44a94233d}, isbn = {978-1-4244-1592-2}, keywords = {dblp}, pages = {261-268}, publisher = {IEEE}, timestamp = {2016-02-02T11:49:45.000+0100}, title = {Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability.}, url = {http://dblp.uni-trier.de/db/conf/socc/socc2007.html#TsienaWWRHV07}, year = 2007 }