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Disambiguation of "Keim, Martin"

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Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits.

, , and . ASP-DAC, page 315-318. IEEE Computer Society, (1999)

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Leon Keim University of Stuttgart

Jens Keim University of Stuttgart

Hon. -Prof. Dr. Bernhard Keimer University of Stuttgart

Martin Baumann

Martin Schwartz University of Stuttgart

 

Other publications of authors with the same name

Re-using chip level DFT at board level., , , , , , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor., , , , , , and . ITC, page 1-10. IEEE, (2015)Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm., , , and . ISMVL, page 215-221. IEEE Computer Society, (1998)Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits., , and . ASP-DAC, page 315-318. IEEE Computer Society, (1999)Symbolic methods for testing digital circuits.. University of Freiburg, Freiburg im Breisgau, Germany, (2003)Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model., , , , , and . ITC, page 1-10. IEEE Computer Society, (2008)Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy., , and . DAC, page 339-344. ACM Press, (1995)Adapting an industrial memory BIST solution for testing CAMs., , , , , , , and . ITC-Asia, page 112-117. IEEE, (2017)Silicon Evaluation of Static Alternative Fault Models., , , , , and . VTS, page 265-270. IEEE Computer Society, (2007)Polynomial Formal Verification of Multipliers., , , , and . VTS, page 150-157. IEEE Computer Society, (1997)