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Value-Added Defect Testing Techniques., and . IEEE Design & Test of Computers, 22 (3): 224-231 (2005)Meeting Nanometer DPM Requirements Through DFT., and . ISQED, page 276-282. IEEE Computer Society, (2005)Achieving High Test Quality with Reduced Pin Count Testing., , , , and . Asian Test Symposium, page 312-317. IEEE Computer Society, (2005)Silicon Evaluation of Static Alternative Fault Models., , , , , and . VTS, page 265-270. IEEE Computer Society, (2007)Test Compression Improvement with EDT Channel Sharing in SoC Designs., , , , , , , and . NATW, page 22-31. IEEE, (2014)The Demand and Practical Approach for 100x Test Compression., and . VLSI-SoC, page 245-250. IEEE, (2006)Subordination properties of P-valent functions defined by integral operators., , and . Int. J. Math. Mathematical Sciences, (2006)Existence and uniqueness of an attractive nonlinear diffusion system., and . Applied Mathematics and Computation, (2015)Convolutions for special classes of harmonic univalent functions., , and . Appl. Math. Lett., 16 (6): 905-909 (2003)Directional Convexity of Convolutions of Harmonic Functions., and . Int. J. Math. Mathematical Sciences, (2019)