%0 Journal Article %1 journals/dt/JahangiriA05 %A Jahangiri, Jay %A Abercrombie, David %D 2005 %J IEEE Design & Test of Computers %K dblp %N 3 %P 224-231 %T Value-Added Defect Testing Techniques. %U http://dblp.uni-trier.de/db/journals/dt/dt22.html#JahangiriA05 %V 22

@article{journals/dt/JahangiriA05, added-at = {2016-03-09T00:00:00.000+0100}, author = {Jahangiri, Jay and Abercrombie, David}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a21f795d8e65c9db97413d5600dde153/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.74}, interhash = {33da6f0ee190f5ef0e90e52f0f386901}, intrahash = {a21f795d8e65c9db97413d5600dde153}, journal = {IEEE Design & Test of Computers}, keywords = {dblp}, number = 3, pages = {224-231}, timestamp = {2016-03-10T11:19:48.000+0100}, title = {Value-Added Defect Testing Techniques.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt22.html#JahangiriA05}, volume = 22, year = 2005 }