PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Lee, Chung-Len"

Author of the publication

copydeleteadd this publication to your clipboard
Functional test pattern generation for CMOS operational amplifier.

, , and . VTS, page 267-273. IEEE Computer Society, (1997)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Moosung Lee University of Stuttgart

Dongwon Lee University of Stuttgart

Junghwa Lee University of Stuttgart

Phi-Long Chung University of Stuttgart

Ph. D. Benjamin Lee University of Stuttgart

 

Other publications of authors with the same name

TRANS: A Fast and Memory-Efficient Path Delay Fault Simulator., , and . EDAC-ETC-EUROASIC, page 508-512. IEEE Computer Society, (1994)A novel test scheme for NAND flash memory based on built-in oscillator ring., , and . ASICON, page 1-4. IEEE, (2013)New DfT architectures for 3D-SICs with a wireless test port., , , , and . ASICON, page 1-4. IEEE, (2013)Single-fault fault-collapsing analysis in sequential logic circuits., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 10 (12): 1559-1568 (1991)Identifying Untestable Faults in Sequential Circuits., , and . IEEE Design & Test of Computers, 12 (3): 14-23 (1995)A snake addressing scheme for phase change memory testing., , , , , , and . SCIENCE CHINA Information Sciences, 59 (10): 102401 (2016)A Multiple-Sequence Generator Based on Inverted Nonlinear Autonomous Machines., and . IEEE Trans. Computers, 45 (9): 1079-1083 (1996)Simplifying Sequential Circuit Test Generation., and . IEEE Design & Test of Computers, 11 (3): 28-38 (1994)Functional test pattern generation for CMOS operational amplifier., , and . VTS, page 267-273. IEEE Computer Society, (1997)Fault diagnosis for linear analog circuits., , , and . Asian Test Symposium, page 25-30. IEEE Computer Society, (2000)