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Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Toward Radiation-Tolerant Embedded Nonvolatile Memory

, , , , , , , , , , , , , , , , and . IEEE electron device letters, 45 (7): 1165-1168 (2024)
DOI: 10.1109/LED.2023.3332071

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