Author of the publication

Femtosecond transient absorption spectroscopy in alpha-sexithienyl thin films

, , , , , , , , and . Proceedings of the International Conference on Science and Technology of Synthetic Metals : ICSM '98, volume 1 : Conjugated and conducting polymers of Synthetic metals : the journal of electronic polymers and electronic molecular materials, page 555-556. Lausanne, Elsevier, (1999)
DOI: 10.1016/S0379-6779(98)01058-3

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states., , , , , , , and . Microelectronics Reliability, 54 (9-10): 1638-1642 (2014)Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric., , , , , , , , and . Microelectronics Reliability, 53 (9-11): 1798-1803 (2013)Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics., , , , , , , , and . Microelectronics Reliability, 55 (9-10): 1790-1794 (2015)Femtosecond transient absorption spectroscopy in alpha-sexithienyl thin films, , , , , , , , and . Proceedings of the International Conference on Science and Technology of Synthetic Metals : ICSM '98, volume 1 : Conjugated and conducting polymers of Synthetic metals : the journal of electronic polymers and electronic molecular materials, page 555-556. Lausanne, Elsevier, (1999)Effects of constant voltage stress on organic complementary logic inverters., , , , , , , and . ESSDERC, page 298-301. IEEE, (2014)Ambipolar field-effect transistor based on alpha, omega-dihexylquaterthiophene and alpha, omega-diperfluoroquaterthiophene vertical heterojunction., , , , and . Microelectronics Reliability, 50 (9-11): 1861-1865 (2010)