%0 Journal Article %1 journals/mr/WrachienCLMDSTM14 %A Wrachien, Nicola %A Cester, Andrea %A Lago, N. %A Meneghesso, Gaudenzio %A D'Alpaos, Riccardo %A Stefani, Andrea %A Turatti, Guido %A Muccini, Michele %D 2014 %J Microelectronics Reliability %K dblp %N 9-10 %P 1638-1642 %T Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#WrachienCLMDSTM14 %V 54

@article{journals/mr/WrachienCLMDSTM14, added-at = {2018-11-30T00:00:00.000+0100}, author = {Wrachien, Nicola and Cester, Andrea and Lago, N. and Meneghesso, Gaudenzio and D'Alpaos, Riccardo and Stefani, Andrea and Turatti, Guido and Muccini, Michele}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b455b9be0792074c44c09c21f7f47085/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.07.065}, interhash = {151069936fe0028da982603e051be25b}, intrahash = {b455b9be0792074c44c09c21f7f47085}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1638-1642}, timestamp = {2019-09-27T10:58:31.000+0200}, title = {Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#WrachienCLMDSTM14}, volume = 54, year = 2014 }