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Disambiguation of "Costenaro, Enrico"

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Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.

, , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)

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Dr. -Ing. Enrico Pfüller University of Stuttgart

 

Other publications of authors with the same name

Towards optimized functional evaluation of SEE-induced failures in complex designs., and . IOLTS, page 182-187. IEEE Computer Society, (2012)A Practical Approach to Single Event Transient Analysis for Highly Complex Design., , , and . J. Electronic Testing, 29 (3): 301-315 (2013)A call for cross-layer and cross-domain reliability analysis and management., , , and . IOLTS, page 19-22. IEEE, (2015)A novel variation-tolerant 4T-DRAM cell with enhanced soft-error tolerance., , , , , and . ICCD, page 472-477. IEEE Computer Society, (2012)A real-case application of a synergetic design-flow-oriented SER analysis., , , and . IOLTS, page 43-48. IEEE Computer Society, (2012)Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales., , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Exploring the state dependent SET sensitivity of asynchronous logic - The muller-pipeline example., , , , and . ICCD, page 61-67. IEEE Computer Society, (2014)RIIF - Reliability information interchange format., , , , and . IOLTS, page 103-108. IEEE Computer Society, (2012)State-aware single event analysis for sequential logic., , and . IOLTS, page 151-156. IEEE, (2013)Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor., , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (10): 1586-1599 (2015)