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Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.

, , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)

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Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor., , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (10): 1586-1599 (2015)Hot topic session 4A: Reliability analysis of complex digital systems., , , , and . VTS, page 1. IEEE Computer Society, (2013)Managing SER costs of complex systems through Linear Programming., , , , and . IOLTS, page 216-219. IEEE, (2014)RIIF-2: Toward the next generation reliability information interchange format., , , , , and . IOLTS, page 173-178. IEEE, (2016)Analysis of advanced circuits for SET measurement., , , , , , , and . IRPS, page 7. IEEE, (2015)BPPT - Bulk potential protection technique for hardened sequentials., , , , , , , , , and 2 other author(s). IOLTS, page 28-32. IEEE, (2017)A Class of SEC-DED-DAEC Codes Derived From Orthogonal Latin Square Codes., , , and . IEEE Trans. VLSI Syst., 23 (5): 968-972 (2015)A call for cross-layer and cross-domain reliability analysis and management., , , and . IOLTS, page 19-22. IEEE, (2015)A Method to Design Single Error Correction Codes With Fast Decoding for a Subset of Critical Bits., , , and . IEEE Trans. on Circuits and Systems, 63-II (2): 171-175 (2016)New approaches for synthesis of redundant combinatorial logic for selective fault tolerance., , , , , , and . IOLTS, page 62-68. IEEE, (2014)