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Analysis and Mitigation of IR-Drop Induced Scan Shift-Errors

, , , , , , , and . Proceedings of the IEEE International Test Conference (ITC'17), page 1--8. Fort Worth, Texas, USA, (2017)
DOI: 10.1109/TEST.2017.8242055

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Analysis and Mitigation of IR-Drop Induced Scan Shift-Errors, , , , , , , and . Proceedings of the IEEE International Test Conference (ITC'17), page 1--8. Fort Worth, Texas, USA, (2017)Analysis and mitigation or IR-Drop induced scan shift-errors, , , , , , , and . 2017 IEEE International Test Conference (ITC), Piscataway, IEEE, (2017)