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Disambiguation of "Santos, Marcelino B."

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On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.

, , , , , and . J. Electronic Testing, 20 (4): 345-355 (2004)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

B. Schlecht

Max B. Schäfer

Aldilene Santos Franca University of Stuttgart

Kevin Laranjeira dos Santos University of Stuttgart

Daniela Silva dos Santos University of Stuttgart

 

Other publications of authors with the same name

Gate Driver Voltage Optimization for Multi-Mode Low Power DC-DC Conversion., , , , and . J. Low Power Electronics, 5 (2): 241-254 (2009)Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System., , , and . J. Electronic Testing, 18 (3): 285-294 (2002)Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs., , , , and . DFT, page 109-116. IEEE Computer Society, (1993)Performance sensor for tolerance and predictive detection of delay-faults., , , , , , and . DFT, page 110-115. IEEE Computer Society, (2014)Enhancing the Tolerance to Power-Supply Instability in Digital Circuits., , , , , , and . ISVLSI, page 207-212. IEEE Computer Society, (2007)Quality of Electronic Design: From Architectural Level to Test Coverage., , , , and . ISQED, page 197-. IEEE Computer Society, (2000)Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits., , , , , , and . DDECS, page 295-300. IEEE Computer Society, (2007)Test preparation for high coverage of physical defects in CMOS digital ICs., , , and . VTS, page 330-337. IEEE Computer Society, (1995)DFT and Probabilistic Testability Analysis at RTL., , , and . HLDVT, page 41-47. IEEE Computer Society, (2006)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity., , , , , , , and . ISCAS (1), page 110-113. IEEE, (1999)