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Scan based speed-path debug for a microprocessor.

, , , , , , and . European Test Symposium, page 207-212. IEEE Computer Society, (2010)

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Improving the simulation efficiency in five-axis milling by using an advanced octree and an implicit formula of a generalized cutter., and . J. Systems Science & Complexity, 26 (5): 735-756 (2013)Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree., , , , and . DFT, page 217-225. IEEE Computer Society, (2011)Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive., , , , , and . VTS, page 66-71. IEEE Computer Society, (2006)Using Scan-Dump Values to Improve Functional-Diagnosis Methodology., , , , , and . VTS, page 231-238. IEEE Computer Society, (2007)Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns., , , , , and . Asian Test Symposium, page 35-40. IEEE Computer Society, (2009)Diagnosis of Multiple Physical Defects Using Logic Fault Models., , , and . Asian Test Symposium, page 94-99. IEEE Computer Society, (2010)Speed-Path Debug Using At-Speed Scan Test Patterns., , and . European Test Symposium, page 11-16. IEEE Computer Society, (2009)Enabling yield analysis with X-compact., , , and . ITC, page 9. IEEE Computer Society, (2005)A Robust Automated Scan Pattern Mismatch Debugger., , and . ATS, page 309-314. IEEE Computer Society, (2008)Enhancing Transition Fault Model for Delay Defect Diagnosis., , , , , , , , and . ATS, page 179-184. IEEE Computer Society, (2008)