Author of the publication

A Novel Approach to Mitigate Power Side-Channel Attacks for Emerging Negative Capacitance Transistor Technology

, , , , and . 2022 20th IEEE Interregional NEWCAS Conference (NEWCAS), page 504-508. Piscataway, IEEE, (2022)
DOI: 10.1109/NEWCAS52662.2022.9842186

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Evaluation of the BSIM6 compact MOSFET model's scalability in 40nm CMOS technology., , , , , , , and . ESSCIRC, page 34-37. IEEE, (2012)BSIM compact MOSFET models for SPICE simulation., , , , , , , , , and 1 other author(s). MIXDES, page 23-28. IEEE, (2013)BSIM6 - Benchmarking the Next-Generation MOSFET Model for RF Applications., , , , , and . VLSI Design, page 421-426. IEEE Computer Society, (2014)Suspended-gate FET as a sleep transistor for ultra-low stand-by power applications., , , and . Nano-Net, page 8. ICST/ACM, (2007)Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage, , , , and . IEEE transactions on electron devices, 69 (9): 5316-5323 (2022)BEOL FeFET SPICE-Compatible Model for Benchmarking 3-D Monolithic In-Memory TCAM Computation, , , and . IEEE transactions on electron devices, 70 (12): 6286-6292 (2023)Modeling STI Edge Parasitic Current for Accurate Circuit Simulations., , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (8): 1291-1294 (2015)Performance, Power and Cooling Trade-Offs with NCFET-based Many-Cores., , , , , and . DAC, page 41. ACM, (2019)Unified Model for Sub-Bandgap and Conventional Impact Ionization in RF SOI MOSFETs with Improved Simulator Convergence., , , , and . VLSI Design, page 328-333. IEEE Computer Society, (2016)BSIM-BULK: Accurate Compact Model for Analog and RF Circuit Design., , , , and . CICC, page 1-8. IEEE, (2019)