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BEOL FeFET SPICE-Compatible Model for Benchmarking 3-D Monolithic In-Memory TCAM Computation

, , , and . IEEE transactions on electron devices, 70 (12): 6286-6292 (2023)
DOI: 10.1109/TED.2023.3327034

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Dr. -Ing. Hussam Amrouch University of Stuttgart

Modeling and Investigating Total Ionizing Dose Impact on FeFET, , and . IEEE journal on exploratory solid-state computational devices and circuits, 9 (2): 143-150 (2023)
 

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