%0 Journal Article %1 journals/tcad/AmrouchEH14 %A Amrouch, Hussam %A Ebi, Thomas %A Henkel, Jörg %D 2014 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 5 %P 677-690 %T RESI: Register-Embedded Self-Immunity for Reliability Enhancement. %U http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#AmrouchEH14 %V 33

@article{journals/tcad/AmrouchEH14, added-at = {2014-04-28T00:00:00.000+0200}, author = {Amrouch, Hussam and Ebi, Thomas and Henkel, Jörg}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29c40835a9460f91b718f945bcf68c1d4/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2013.2295799}, interhash = {ed58ea647c87404f91ffcffa4a38382d}, intrahash = {9c40835a9460f91b718f945bcf68c1d4}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 5, pages = {677-690}, timestamp = {2016-02-02T10:07:44.000+0100}, title = {RESI: Register-Embedded Self-Immunity for Reliability Enhancement.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#AmrouchEH14}, volume = 33, year = 2014 }