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Accelerating Conversational Agents Built With Off-the-Shelf Modularized Services.

, , , , and . IEEE Pervasive Computing, 18 (2): 47-57 (2019)

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Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models., , and . VTS, page 357-366. IEEE Computer Society, (2002)Guest Editors' Introduction: Yield Learning Processes and Methods., and . IEEE Design & Test of Computers, 29 (1): 6-7 (2012)Smart-Substrate Multichip-Module Systems., , , , , and . IEEE Design & Test of Computers, 11 (2): 64-73 (1994)Getting More out of ITC.. IEEE Design & Test of Computers, 23 (5): 432 (2006)Deformations of IC Structure in Test and Yield Learning., , , , , and . ITC, page 856-865. IEEE Computer Society, (2003)Detecting delay faults using power supply transient signal analysis., , , , and . ITC, page 395-404. IEEE Computer Society, (2001)Using well/substrate bias manipulation to enhance voltage-test-based defect detection., and . ITC, page 1-6. IEEE Computer Society, (2011)To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM.. ISPD, page 47. ACM, (2006)High-performance CMOS variability in the 65-nm regime and beyond., , , , , , , , and . IBM Journal of Research and Development, 50 (4-5): 433-450 (2006)