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Disambiguation of "Reddy, Sudhakar M."

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Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects.

, , , , and . VTS, page 1-6. IEEE Computer Society, (2015)

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M. Nudischer

M. Kratzer

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M. Christmann

 

Other publications of authors with the same name

Further Results on Convolutional Codes Derived from Block Codes. Information and Control, 13 (4): 357-362 (October 1968)A Class of High-Rate Double-Error-Correcting Convolutional Codes, , and . Information and Control, 16 (3): 225-230 (May 1970)Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Functional Test Sequences., and . DFT, page 358-366. IEEE Computer Society, (2009)On-chip Generation of the Second Primary Input Vectors of Broadside Tests., and . DFT, page 38-46. IEEE Computer Society, (2009)Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree., , , , and . DFT, page 217-225. IEEE Computer Society, (2011)Test Generation for Open Defects in CMOS Circuits., , , , and . DFT, page 41-49. IEEE Computer Society, (2006)Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST., , and . VLSI Design, page 604-. IEEE Computer Society, (2002)MUSTC-Testing: Multi-Stage-Combinational Test scheduling at the Register-Transfer Level., , and . VLSI Design, page 110-115. IEEE Computer Society, (1995)Efficient SAT-Based Circuit Initialization for Larger Designs., , , and . VLSI Design, page 62-67. IEEE Computer Society, (2014)On Full Reset as a Design-For-Testability Technique., and . VLSI Design, page 534-536. IEEE Computer Society, (1997)