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Disambiguation of "Eklow, Bill"

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Re-using chip level DFT at board level.

, , , , , , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)

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apl. Prof. Dr. Joachim Bill University of Stuttgart

 

Other publications of authors with the same name

On Effective Through-Silicon Via Repair for 3-D-Stacked ICs., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 32 (4): 559-571 (2013)What Do You Mean My Board Test Stinks?. ITC, page 1423. IEEE Computer Society, (2004)A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs., , and . ITC, page 1-10. IEEE Computer Society, (2014)Realizing High Test Quality Goals with Smart Test Resource Usage., , , , , , , and . ITC, page 525-533. IEEE Computer Society, (2004)FALCON: Rapid statistical fault coverage estimation for complex designs., , , , and . ITC, page 1-10. IEEE Computer Society, (2012)IEEE P1687: Toward Standardized Access of Embedded Instrumentation., , , , , , , , and . ITC, page 1-8. IEEE Computer Society, (2006)Recap of the ITC15 Test Conference.. IEEE Design & Test, 33 (1): 85-86 (2016)On effective TSV repair for 3D-stacked ICs., , and . DATE, page 793-798. IEEE, (2012)Status of IEEE Testability Standards 1149.4, 1532 and 1149.6., , , , , , , and . DATE, page 1184-1191. IEEE Computer Society, (2004)Parametric Testing of Optical Interfaces., , and . ITC, page 1. IEEE Computer Society, (2008)