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Guest Editor's Introduction.. IEEE Design & Test of Computers, 12 (2): 6-7 (1995)Status of IEEE Testability Standards 1149.4, 1532 and 1149.6., , , , , , , and . DATE, page 1184-1191. IEEE Computer Society, (2004)Test Technology in Europe.. IEEE Design & Test of Computers, 7 (1): 6-8 (1990)Guest Editors' Introduction: Board Test., and . IEEE Design & Test of Computers, 20 (2): 5-7 (2003)Built-In Self-Test: Assuring System Integrity., , , and . IEEE Computer, 29 (11): 39-45 (1996)Fault Diagnosis of Digital Systems - A Review., and . Comput. J., 14 (2): 199-206 (1971)Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint., , , and . IEEE Design & Test of Computers, 20 (2): 8-18 (2003)Boundary Scan: The Internet of Test., , and . IEEE Design & Test of Computers, 16 (3): 34-43 (1999)Macro Testability: The Results of Production Device Applications., , , , and . ITC, page 232-241. IEEE Computer Society, (1992)Essential reading for the basics and implementation of boundary scan: Parker, K PThe boundary-scan handbook Kluwer Academic, Dordrecht, The Netherlands (1992) ISBN 0 7923 9270 1, £48.00/Dfl. 160.00, pp 282.. Microprocessors and Microsystems - Embedded Hardware Design, 17 (5): 304 (1993)