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Disambiguation of "Bota, Sebastià A."

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Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.

, , , , and . ITC, page 1276-1284. IEEE Computer Society, (2004)

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A. Laukemann

A. Laukemann

A. Laukemann

A. Vo{\ss}

A. Afkari

 

Other publications of authors with the same name

Application of Predictive Oscillation-Based Test to a CMOS OpAmp., , , , , and . IEEE Trans. Instrumentation and Measurement, 59 (8): 2076-2082 (2010)Smart Temperature Sensor for Thermal Testing of Cell-Based ICs., , , and . DATE, page 464-465. IEEE Computer Society, (2005)Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications., , and . DATE, page 1-6. European Design and Automation Association, (2014)Accurate alpha soft error rate evaluation in SRAM memories., , , , and . IOLTS, page 205-209. IEEE, (2013)Smart Temperature Sensor for On-Line Monitoring in Automotive Applications., , , , , , , , , and . IOLTW, page 122-126. IEEE Computer Society, (2001)A Module for BiST of CMOS RF Receivers., , , , , and . J. Electronic Testing, 23 (6): 605-612 (2007)Force-balance interface circuit based on floating MOSFET capacitors for micro-machined capacitive accelerometers., , , and . IEEE Trans. on Circuits and Systems, 53-II (7): 546-552 (2006)Impact of Thermal Gradients on Clock Skew and Testing., , , , and . IEEE Design & Test of Computers, 23 (5): 414-424 (2006)Leakage Power Characterization Considering Process Variations., , , and . PATMOS, volume 4148 of Lecture Notes in Computer Science, page 66-74. Springer, (2006)Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells., , , , , , , and . SMACD, page 1-4. IEEE, (2017)