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A new extraction technique for the series resistances of semiconductor devices based on the intrinsic properties of bias-dependent y-parameters

, , , , , , , and . Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting, page 148-151. Piscataway, New Jersey, IEEE, (2004)
DOI: 10.1109/BIPOL.2004.1365766

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