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Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

L. Xu, J. Cao, B. Bhuva, I. Chatterjee, S. Wen, R. Wong, and L. Massengill. IRPS, page 1-5. IEEE, (2019)

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R. Koerner

R. Watty

King Cho Wong University of Stuttgart

Dipl.-Ing. Marc Riedlinger

An adaptive self-managing platform for cabin management systemsM. Riedlinger, O. Marquardt, R. Ahmadi, and R. Reichel. CEAS Aeronautical Journal, 7 (3): 483--498 (2016)

An adaptive self-managing platform for cabin management systemsM. Riedlinger, O. Marquardt, R. Ahmadi, and R. Reichel. CEAS Aeronautical Journal, 7 (3): 483--498 (2016)DIANA - Technologien für eine Energie-autarke, intelligente Kabine: Selbstadaptive Kabinenelektronik Plattform : Schlussbericht :M. Riedlinger, and R. Reichel. (2015)An adaptive middleware approach for fault-tolerant avionic systemsO. Marquardt, M. Riedlinger, R. Ahmadi, and R. Reichel. 2015 IEEE Aerospace Conference, Institute of Electrical and Electronics Engineers (IEEE), (March 2015)

Nils Rodrigues University of Stuttgart

A Visual Analytics Approach for Word Relevances in Multiple TextsN. Rodrigues, M. Burch, L. Di Silvestro, and D. Weiskopf. (2017)

Other publications of authors with the same name

Asymptotic expansion of the Tricomi-Carlitz polynomials and their zeros.K. Lee, and R. Wong. J. Computational Applied Mathematics, (2014)A novel generalized solution expansion for the Lagerstrom model.C. Ou, and R. Wong. Asymptotic Analysis, 88 (1-2): 111-123 (2014)LFRic: Meeting the challenges of scalability and performance portability in Weather and Climate models.S. Adams, R. Ford, M. Hambley, J. Hobson, I. Kavcic, C. Maynard, T. Melvin, E. Müller, S. Mullerworth, A. Porter and 3 other author(s). J. Parallel Distrib. Comput., (2019)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.J. Cao, L. Xu, B. Bhuva, S. Wen, R. Wong, B. Narasimham, and L. Massengill. IRPS, page 1-5. IEEE, (2019)Mapping Relational Queries to Network Queries.P. Bernus, R. Topor, and R. Wong. Australasian Database Conference, volume 17 of Australian Computer Science Communications, (1995)LFRic: Meeting the challenges of scalability and performance portability in Weather and Climate models.S. Adams, R. Ford, M. Hambley, J. Hobson, I. Kavcic, C. Maynard, T. Melvin, E. Müller, S. Mullerworth, A. Porter and 3 other author(s). CoRR, (2018)Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.L. Xu, J. Cao, B. Bhuva, I. Chatterjee, S. Wen, R. Wong, and L. Massengill. IRPS, page 1-5. IEEE, (2019)Dynamic Characteristics of Constrained Manipulators for Contact Force Control Design.D. Latornell, D. Cherchas, and R. Wong. I. J. Robotics Res., 17 (3): 211-231 (1998)Single-event effects on optical transceiver.K. Lezon, S. Wen, Y. Dan, R. Wong, and B. Bhuva. IRPS, page 6-1. IEEE, (2018)Design and validation of a simple eye-tracking system.D. Liston, S. Simpson, L. Wong, M. Rich, and L. Stone. ETRA, page 221-224. ACM, (2016)

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Disambiguation of "Wong, R."

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URL
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Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

Please choose a person to relate this publication to

R. Koerner

R. Watty

King Cho Wong University of Stuttgart

Dipl.-Ing. Marc Riedlinger

Nils Rodrigues University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Wong, R."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

Please choose a person to relate this publication to

R. Koerner

R. Watty

King Cho Wong University of Stuttgart

Dipl.-Ing. Marc Riedlinger

Nils Rodrigues University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.