%0 Conference Paper %1 conf/irps/XuCBCWWM19 %A Xu, L. %A Cao, J. %A Bhuva, B. L. %A Chatterjee, Indranil %A Wen, S.-J. %A Wong, R. %A Massengill, Lloyd W. %B IRPS %D 2019 %I IEEE %K dblp %P 1-5 %T Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#XuCBCWWM19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/XuCBCWWM19, added-at = {2019-05-31T00:00:00.000+0200}, author = {Xu, L. and Cao, J. and Bhuva, B. L. and Chatterjee, Indranil and Wen, S.-J. and Wong, R. and Massengill, Lloyd W.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f579541e31df7638e90848d03f58d67e/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720514}, interhash = {49d72bb483caa61c926b0f0958159a27}, intrahash = {f579541e31df7638e90848d03f58d67e}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2019-09-27T13:33:20.000+0200}, title = {Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#XuCBCWWM19}, year = 2019 }