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Enhancing delay fault coverage through low-power segmented scan.

Z. Zhang, S. Reddy, I. Pomeranz, J. Rajski, and B. Al-Hashimi. IET Computers & Digital Techniques, 1 (3): 220-229 (2007)

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On Linear Dependencies in Subspaces of LFSR-Generated Sequences.J. Rajski, and J. Tyszer. IEEE Trans. Computers, 45 (10): 1212-1216 (1996)High Performance Dense Ring Generators.G. Mrugalski, N. Mukherjee, J. Rajski, and J. Tyszer. IEEE Trans. Computers, 55 (1): 83-87 (2006)Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors.J. Rajski, M. Potkonjak, A. Singh, A. Chatterjee, Z. Navabi, M. Guthaus, and S. Gören. VLSI-SoC, IEEE, (2013)EDT Bandwidth Management in SoC Designs.J. Janicki, M. Kassab, G. Mrugalski, N. Mukherjee, J. Rajski, and J. Tyszer. IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (12): 1894-1907 (2012)High Volume Diagnosis in Memory BIST Based on Compressed Failure Data.N. Mukherjee, A. Pogiel, J. Rajski, and J. Tyszer. IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (3): 441-453 (2010)Cell-Aware Test.F. Hapke, W. Redemund, A. Glowatz, J. Rajski, M. Reese, M. Hustava, M. Keim, J. Schloeffel, and A. Fast. IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (9): 1396-1409 (2014)Built-In Self-Test for Systems on Silicon.J. Rajski, J. Tyszer, and S. Patel. VLSI Design, page 609-610. IEEE Computer Society, (1999)Logic Diagnosis and Yield Learning.J. Rajski. DDECS, page 19. IEEE Computer Society, (2007)Low Power Test Compression with Programmable Broadcast-Based Control.S. Milewski, G. Mrugalski, J. Rajski, and J. Tyszer. ATS, page 174-179. IEEE Computer Society, (2014)N-distinguishing Tests for Enhanced Defect Diagnosis.G. Chen, J. Rajski, S. Reddy, and I. Pomeranz. Asian Test Symposium, page 183-186. IEEE Computer Society, (2009)

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Enhancing delay fault coverage through low-power segmented scan.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Enhancing delay fault coverage through low-power segmented scan.

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Enhancing delay fault coverage through low-power segmented scan.