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Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters., , and . VTS, page 236-245. IEEE Computer Society, (1999)Design of Phase Shifters for BIST Applications., and . VTS, page 218-224. IEEE Computer Society, (1998)Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators., , and . VTS, page 377-388. IEEE Computer Society, (2000)A self-driven test structure for pseudorandom testing of non-scan sequential circuits., and . VTS, page 17-25. IEEE Computer Society, (1996)N-distinguishing Tests for Enhanced Defect Diagnosis., , , and . Asian Test Symposium, page 183-186. IEEE Computer Society, (2009)Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating., , , and . Asian Test Symposium, page 267-272. IEEE Computer Society, (2011)Low Power Test Compression with Programmable Broadcast-Based Control., , , and . ATS, page 174-179. IEEE Computer Society, (2014)Cell-Aware Test., , , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (9): 1396-1409 (2014)Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors., , , , , , and . VLSI-SoC, IEEE, (2013)Delay Fault Diagnosis Using Timing Information., , , and . ISQED, page 485-490. IEEE Computer Society, (2004)