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Impact of gate drive voltage on avalanche robustness of trench IGBTs., , , , and . Microelectronics Reliability, 54 (9-10): 1828-1832 (2014)On the avalanche ruggedness of optimized termination structure for 600 V punch-through IGBTs., , , , and . Microelectronics Reliability, (2016)Model-Order Reduction Procedure for Fast Dynamic Electrothermal Simulation of Power Converters., , , , , , , , , and . ApplePies, volume 512 of Lecture Notes in Electrical Engineering, page 81-87. Springer, (2017)3D electro-thermal simulations of wide area power devices operating in avalanche condition., , , , , , , and . Microelectronics Reliability, 52 (9-10): 2385-2390 (2012)200 V Fast Recovery Epitaxial Diode with superior ESD capability., , , , , , , , , and 1 other author(s). Microelectronics Reliability, (2016)Physically based analytical model of the blocking I-V curve of Trench IGBTs., , , and . Microelectronics Reliability, 53 (9-11): 1783-1787 (2013)Development and optimization of an energy harvesting circuit for multiple piezoelectric elements integrated into a smart air spring., , , , , , , and . RTSI, page 320-324. IEEE, (2019)A robust electro-thermal IGBT SPICE model: Application to short-circuit protection circuit design., , , , , , , and . Microelectronics Reliability, 55 (9-10): 1971-1975 (2015)Wide Range AWG-Based FBG Interrogation System With Improved Sensitivity., , , , and . PRIME, page 149-152. IEEE, (2019)