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%0 Journal Article
%1 journals/mr/IraceMMRBBCNBPS16
%A Irace, Andrea
%A Maresca, Luca
%A Mirone, Paolo
%A Riccio, Michele
%A Breglio, Giovanni
%A Bellemo, L.
%A Carta, R.
%A Naretto, M.
%A Baradai, N. El
%A Para, I.
%A Santo, N. Di
%D 2016
%J Microelectronics Reliability
%K dblp
%P 440-446
%T 200 V Fast Recovery Epitaxial Diode with superior ESD capability.
%U http://dblp.uni-trier.de/db/journals/mr/mr64.html#IraceMMRBBCNBPS16
%V 64
@article{journals/mr/IraceMMRBBCNBPS16,
added-at = {2018-11-30T00:00:00.000+0100},
author = {Irace, Andrea and Maresca, Luca and Mirone, Paolo and Riccio, Michele and Breglio, Giovanni and Bellemo, L. and Carta, R. and Naretto, M. and Baradai, N. El and Para, I. and Santo, N. Di},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ef1002859dcafd9e1f25e3d1af05400f/dblp},
ee = {https://doi.org/10.1016/j.microrel.2016.07.022},
interhash = {38b1a7e62b5d044a0c2b54c4a1d5a3e9},
intrahash = {ef1002859dcafd9e1f25e3d1af05400f},
journal = {Microelectronics Reliability},
keywords = {dblp},
pages = {440-446},
timestamp = {2019-09-27T10:58:34.000+0200},
title = {200 V Fast Recovery Epitaxial Diode with superior ESD capability.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#IraceMMRBBCNBPS16},
volume = 64,
year = 2016
}
