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Disambiguation of "Naviner, Jean-François"

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Exploring the feasibility of selective hardening for combinational logic.

, , , and . Microelectronics Reliability, 52 (9-10): 1843-1847 (2012)

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Davi Francois University of Stuttgart

Jean-Noel Grad University of Stuttgart

Jean-Louis Hoslauer University of Stuttgart

Dr. Eric Jean Kervio University of Stuttgart

 

Other publications of authors with the same name

A Novel Approach to Non Coherent UWB Reception., , and . IMTIC, volume 20 of Communications in Computer and Information Science, page 100-109. Springer, (2008)An Optimizable Model for Process Independent Symbolic Design., and . EDAC-ETC-EUROASIC, page 660. IEEE Computer Society, (1994)A switched-current sample and hold circuit for low frequency applications., , and . ISCAS (1), page 452-455. IEEE, (2001)A synthesis methodology for AMS/RF circuit reliability: Application to a DCO design., , and . Microelectronics Reliability, 51 (4): 765-772 (2011)Cross-layer investigation of continuous-time sigma-delta modulator under aging effects., , , , , and . Microelectronics Reliability, 55 (3-4): 645-653 (2015)Exploring the feasibility of selective hardening for combinational logic., , , and . Microelectronics Reliability, 52 (9-10): 1843-1847 (2012)A Hierarchical Reliability Simulation Methodology for AMS Integrated Circuits and Systems., , and . J. Low Power Electronics, 8 (5): 697-705 (2012)Mixed-Signal Clock-Skew Calibration Technique for Time-Interleaved ADCs., , , and . IEEE Trans. on Circuits and Systems, 55-I (11): 3676-3687 (2008)On the output events in concurrent error detection schemes., , , and . ICECS, page 978-981. IEEE, (2008)Designing a programmable analog signal conditioning circuit without loss of measurement range., , , and . IEEE Trans. Instrumentation and Measurement, 52 (5): 1482-1487 (2003)