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Exploring the feasibility of selective hardening for combinational logic.

, , , and . Microelectronics Reliability, 52 (9-10): 1843-1847 (2012)

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Automatic selective hardening against soft errors: A cost-based and regularity-aware approach., , , and . ICECS, page 753-756. IEEE, (2012)SNaP: A novel hybrid method for circuit reliability assessment under multiple faults., , , and . Microelectronics Reliability, 53 (9-11): 1230-1234 (2013)Design and Analysis of Binary Tree Static Random Access Memory for Low Power Embedded Systems., , , , and . J. Low Power Electronics, 10 (3): 467-478 (2014)A hybrid reliability assessment method and its support of sequential logic modelling., , , and . IOLTS, page 182-183. IEEE, (2014)Selective hardening against multiple faults employing a net-based reliability analysis., , and . NEWCAS, page 1-4. IEEE, (2013)Exploring the feasibility of selective hardening for combinational logic., , , and . Microelectronics Reliability, 52 (9-10): 1843-1847 (2012)Application and Product-Volume-Specific Customization of BEOL Metal Pitch., , , and . IEEE Trans. VLSI Syst., 26 (9): 1627-1636 (2018)Single event transient mitigation through pulse quenching: Effectiveness at circuit level., , and . ICECS, page 121-124. IEEE, (2013)A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs., , , , and . Microelectronics Reliability, 53 (9-11): 1189-1193 (2013)A placement strategy for reducing the effects of multiple faults in digital circuits., and . IOLTS, page 69-74. IEEE, (2014)