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Disambiguation of "Gall, Martin"

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Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects using high statistical sampling.

, , , , , , and . IRPS, page 4. IEEE, (2018)

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Christian Gall University of Stuttgart

Matthias Galla University of Stuttgart

Simona Galliani University of Stuttgart

Daniel Galla University of Stuttgart

Dr. Kathrin Gallmeister University of Stuttgart

 

Other publications of authors with the same name

Impact of stress-induced backflow on full-chip electromigration risk assessment., , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 25 (6): 1038-1046 (2006)Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments., , , , , , , , , and 2 other author(s). ESSDERC, page 178-181. IEEE, (2018)Advanced methods for mechanical and structural characterization of nanoscale materials for 3D IC integration., , , , , , and . Microelectronics Reliability, 54 (9-10): 1959-1962 (2014)A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification., , , , , , and . ISQED, page 232-237. IEEE Computer Society, (2004)Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects using high statistical sampling., , , , , , and . IRPS, page 4. IEEE, (2018)Empirical BEOL-TDDB evaluation based on I(t)-trace analysis., , , and . Microelectronics Reliability, 54 (9-10): 1671-1674 (2014)Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation., , , , , , , , , and 3 other author(s). IRPS, page 5. IEEE, (2018)