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Probabilistic standard cell modeling considering non-Gaussian parameters and correlations., , , , , and . DATE, page 1-4. European Design and Automation Association, (2014)Generator based approach for analog circuit and layout design and optimization., , and . DATE, page 1675-1680. IEEE, (2011)Fehler vermeiden oder tolerieren? Methoden zur Berücksichtigung der Zuverlässigkeit im Entwurf integrierter Schaltungen., , and . GI-Jahrestagung, volume P-246 of LNI, page 1383. GI, (2015)Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation., , , , , , , , , and 3 other author(s). IRPS, page 5. IEEE, (2018)Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters., , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 35 (2): 197-210 (2016)The need and opportunities of electromigration-aware integrated circuit design., , , , and . ICCAD, page 96. ACM, (2018)Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments., , , , , , , , , and 2 other author(s). ESSDERC, page 178-181. IEEE, (2018)