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Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments.

J. Warmuth, K. Giering, A. Lange, A. Clausner, S. Schlipf, G. Kurz, M. Otto, J. Paul, R. Jancke, A. Aal, M. Gall, and E. Zschech. ESSDERC, page 178-181. IEEE, (2018)

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André Jaquemod University of Stuttgart

Univ. -Prof. Dr. -Ing. André Zimmermann University of Stuttgart

75 Jahre Institut für Mikrointegration (IFM) Universität StuttgartA. Zimmermann, and I. Burk. Stuttgart, Universität Stuttgart, Institut für Mikrointegration, (2019)

Univ. -Prof. Dr. rer. nat. André Thess University of Stuttgart

Dr. -Ing. André Buchau University of Stuttgart

André Weiß University of Stuttgart

Other publications of authors with the same name

Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments.J. Warmuth, K. Giering, A. Lange, A. Clausner, S. Schlipf, G. Kurz, M. Otto, J. Paul, R. Jancke, A. Aal and 2 other author(s). ESSDERC, page 178-181. IEEE, (2018)Eigenschafts- und Modellbasierte Spezifikation: Ein Erfahrungsbericht.K. Tochtermann, and A. Lange. Grundlagen von Datenbanken, volume Bericht 94-01 of Universität Magdeburg, Forschungsbericht, page 127-131. Universität Magdeburg, (1994)Towards probabilistic analog behavioral modeling.A. Lange, I. Harasymiv, O. Eisenberger, F. Roger, J. Haase, and R. Minixhofer. ISCAS, page 2728-2731. IEEE, (2015)Probabilistic standard cell modeling considering non-Gaussian parameters and correlations.A. Lange, C. Sohrmann, R. Jancke, J. Haase, I. Lorenz, and U. Schlichtmann. DATE, page 1-4. European Design and Automation Association, (2014)Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation.A. Clausner, S. Schlipf, G. Kurz, M. Otto, J. Paul, K. Giering, J. Warmuth, A. Lange, R. Jancke, A. Aal and 3 other author(s). IRPS, page 5. IEEE, (2018)Fitting standard cell performance to generalized Lambda distributions.A. Lange, J. Haase, and H. Mau. ACM Great Lakes Symposium on VLSI, page 259-264. ACM, (2011)Hybrid dynamical systems for memristor modelling an approach avoiding the terminal-state problem.J. Haase, and A. Lange. FDL, page 1-6. IEEE, (2013)Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters.A. Lange, C. Sohrmann, R. Jancke, J. Haase, B. Cheng, A. Asenov, and U. Schlichtmann. IEEE Trans. on CAD of Integrated Circuits and Systems, 35 (2): 197-210 (2016)Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits.A. Lange, F. Gonzalez, I. Lahbib, and S. Crocoll. ESSDERC, page 186-189. IEEE, (2019)

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Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments.

Please choose a person to relate this publication to

André Jaquemod University of Stuttgart

Univ. -Prof. Dr. -Ing. André Zimmermann University of Stuttgart

Univ. -Prof. Dr. rer. nat. André Thess University of Stuttgart

Dr. -Ing. André Buchau University of Stuttgart

André Weiß University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Lange, André"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments.

Please choose a person to relate this publication to

André Jaquemod University of Stuttgart

Univ. -Prof. Dr. -Ing. André Zimmermann University of Stuttgart

Univ. -Prof. Dr. rer. nat. André Thess University of Stuttgart

Dr. -Ing. André Buchau University of Stuttgart

André Weiß University of Stuttgart

Other publications of authors with the same name

Disambiguation

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URL
DOI
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Chicago
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Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments.