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A Lumped Parameter Model to Study Atrioventricular Valve Regurgitation in Stage 1 and Changes Across Stage 2 Surgery in Single Ventricle Patients.

, , , , , and . IEEE Trans. Biomed. Engineering, 65 (11): 2450-2458 (2018)

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RazorII: In Situ Error Detection and Correction for PVT and SER Tolerance., , , , , , , and . J. Solid-State Circuits, 44 (1): 32-48 (2009)AUDIT: Stress Testing the Automatic Way., , , , , , and . MICRO, page 212-223. IEEE Computer Society, (2012)A Charge-Injection-Based Active-Decoupling Technique for Inductive-Supply-Noise Suppression., and . ISSCC, page 416-417. IEEE, (2008)Energy Optimization of Subthreshold-Voltage Sensor Network Processors., , , , , , , , and . ISCA, page 197-207. IEEE Computer Society, (2005)Power grid physics and implications for CAD., and . DAC, page 199-204. ACM, (2006)Power Grid Physics and Implications for CAD., , and . IEEE Design & Test of Computers, 24 (3): 246-254 (2007)Vectorless Analysis of Supply Noise Induced Delay Variation., , , , and . ICCAD, page 184-192. IEEE Computer Society / ACM, (2003)Static timing analysis considering power supply variations., and . ICCAD, page 365-371. IEEE Computer Society, (2005)Automating Stressmark Generation for Testing Processor Voltage Fluctuations., , , , , , and . IEEE Micro, 33 (4): 66-75 (2013)An Active Decoupling Capacitance Circuit for Inductive Noise Suppression in Power Supply Networks., and . ICCD, page 168-173. IEEE, (2006)