Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Exploiting an I-IP for In-Field SOC Test., , and . DFT, page 404-412. IEEE Computer Society, (2004)An experimental analysis of the effectiveness of the circular self-test path technique., , and . EURO-DAC, page 246-251. IEEE Computer Society, (1994)Verifying Reliability (Dagstuhl Seminar 12341)., , , , and . Dagstuhl Reports, 2 (8): 57-73 (2012)Software-Based Testing for System Peripherals., , , , , and . J. Electronic Testing, 28 (2): 189-200 (2012)On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors., , and . IEEE Trans. VLSI Syst., 22 (4): 813-823 (2014)A Flexible Framework for the Automatic Generation of SBST Programs., , , , and . IEEE Trans. VLSI Syst., 24 (10): 3055-3066 (2016)Scan-Chain Intra-Cell Aware Testing., , , , , , and . IEEE Trans. Emerging Topics Comput., 6 (2): 278-287 (2018)Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug., , , and . IET Computers & Digital Techniques, 4 (2): 104-113 (2010)GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 15 (8): 991-1000 (1996)New Techniques to Reduce the Execution Time of Functional Test Programs., , , and . IEEE Trans. Computers, 66 (7): 1268-1273 (2017)