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%0 Journal Article
%1 journals/tcad/CornoPRR96
%A Corno, Fulvio
%A Prinetto, Paolo
%A Rebaudengo, Maurizio
%A Reorda, Matteo Sonza
%D 1996
%J IEEE Trans. on CAD of Integrated Circuits and Systems
%K dblp
%N 8
%P 991-1000
%T GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits.
%U http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#CornoPRR96
%V 15
@article{journals/tcad/CornoPRR96,
added-at = {2018-11-14T00:00:00.000+0100},
author = {Corno, Fulvio and Prinetto, Paolo and Rebaudengo, Maurizio and Reorda, Matteo Sonza},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b04b41fe667968838f3585b4397af509/dblp},
ee = {https://www.wikidata.org/entity/Q57987047},
interhash = {2be4e0a61d538cef0f2c986bea17c501},
intrahash = {b04b41fe667968838f3585b4397af509},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
keywords = {dblp},
number = 8,
pages = {991-1000},
timestamp = {2019-09-27T08:26:50.000+0200},
title = {GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits.},
url = {http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#CornoPRR96},
volume = 15,
year = 1996
}
