%0 Conference Paper %1 conf/essderc/MakarovLTKRCVHE19 %A Makarov, Alexander %A Linten, Dimitri %A Tyaginov, Stanislav %A Kaczer, Ben %A Roussel, Philippe %A Chasin, Adrian %A Vandemaele, Michiel %A Hellings, Geert %A El-Sayed, Al-Moatasem %A Jech, Markus %A Grasser, Tibor %B ESSDERC %D 2019 %I IEEE %K dblp %P 262-265 %T Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2019.html#MakarovLTKRCVHE19 %@ 978-1-7281-1539-9

@inproceedings{conf/essderc/MakarovLTKRCVHE19, added-at = {2019-11-28T00:00:00.000+0100}, author = {Makarov, Alexander and Linten, Dimitri and Tyaginov, Stanislav and Kaczer, Ben and Roussel, Philippe and Chasin, Adrian and Vandemaele, Michiel and Hellings, Geert and El-Sayed, Al-Moatasem and Jech, Markus and Grasser, Tibor}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a082f1aa45be40b5751229c5f3d48e60/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2019}, ee = {https://doi.org/10.1109/ESSDERC.2019.8901721}, interhash = {56766984cfab608afdf3d58c3b331c8d}, intrahash = {a082f1aa45be40b5751229c5f3d48e60}, isbn = {978-1-7281-1539-9}, keywords = {dblp}, pages = {262-265}, publisher = {IEEE}, timestamp = {2019-12-11T13:00:52.000+0100}, title = {Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2019.html#MakarovLTKRCVHE19}, year = 2019 }